Dr. Nikola Stojanovic Profile

Dr. Nikola Stojanovic

at DESY

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Author

Publications (4)

Proceedings Article | 14 May 2019 Presentation

Time-resolved studies of the diamond-to-graphite transition induced by a short-wavelength free-electron laser radiation (Conference Presentation)

Sven Toleikis, Franz Tavella, Hauke Höppner, Victor Tkachenko, Nikita Medvedev, Flavio Capotondi, Torsten Golz, Yun Kai, Michele Manfredda, Emanuele Pedersoli, Mark Prandolini, Nikola Stojanovic, Takanori Tanikawa, Ulrich Teubner, Beata Ziaja

Proceedings Volume 11035, 1103508 (2019) https://doi.org/10.1117/12.2523139

KEYWORDS: Free electron lasers, Extreme ultraviolet, Diamond, Laser optics, Phase measurement, Time metrology, Ultrafast phenomena, Femtosecond phenomena

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Proceedings Article | 18 May 2009 Paper

Interaction of intense ultrashort XUV pulses with silicon

R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hakova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. Hau-Reige, R. London

Proceedings Volume 7361, 736107 (2009) https://doi.org/10.1117/12.822152

KEYWORDS: Extreme ultraviolet, Silicon, Atomic force microscopy, Free electron lasers, Laser damage threshold, Optical microscopy, Sensors, Femtosecond phenomena, Absorption, Crystals

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Proceedings Article | 18 May 2009 Paper

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

J. Chalupský, L. Juha, V. Hájková, J. Cihelka, L. Vysin, J. Gautier, J. Hajdu, S. Hau-Riege, M. Jurek, J. Krzywinski, Ri. London, E. Papalazarou, J. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, C. Valentin, H. Wabnitz, P. Zeitoun

Proceedings Volume 7361, 736108 (2009) https://doi.org/10.1117/12.822297

KEYWORDS: Polymethylmethacrylate, Laser ablation, X-rays, Solids, Atomic force microscopy, X-ray lasers, Chemical species, Signal attenuation, Gaussian beams, Surface roughness

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Proceedings Article | 13 September 2002 Paper

Microscopic characterization of ablation craters produced by femtosecond laser pulses

Vassili Temnov, Klaus Sokolowski-Tinten, Nikola Stojanovic, Sergei Kudryashov, Dietrich von der Linde, Boris Kogan, Andreas Schlarb, Bastian Weyers, Rolf Moeller, Joerg Seekamp, Clivia Sotomayor-Torres

Proceedings Volume 4760, (2002) https://doi.org/10.1117/12.482062

KEYWORDS: Laser ablation, Scanning electron microscopy, Gallium arsenide, Femtosecond phenomena, Atomic force microscopy, Silicon, Ultrafast phenomena, Laser damage threshold, Semiconductors, Solids

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